Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...