Atomic Force Microscopy (AFM) is an established nanoscale imaging technique, offering a topographic map of a surface sample high spatial resolution. The main drawback, until recently, of using AFM has ...

insights from industryDr. Heiko HaschkeDirector BioAFM BusinessBruker BioAFM In this interview, Dr. Heiko Haschke, Director BioAFM Business, Bruker Nano Surfaces and Metrology Division talks to ...

The JPK NanoWizard ® V from Bruker Nano Surfaces integrates high spatio-temporal resolution with a large scan area, flexible experiment design and outstanding integration with the latest optical ...

Scientists used Atomic Force Microscopy to watch nano droplets in real time, exposing how water interacts with surfaces and improving energy and semiconductor technologies. (Nanowerk News) Water ...

(Nanowerk News) For the first time, the subsurface structural change of silica glass due to nanoscale wear and damage has been revealed via spectroscopy, which may lead to improvements in glass ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy The Nexus system reliably ...

Hybrid bonding is becoming more critical for advanced semiconductor packaging, thanks to its ability to enable high-density interconnects inside complex 3D assemblies. This approach involves the ...

DUBLIN, July 19, 2021 /PRNewswire/ -- The "The Global Market for Nanostructured Coatings, Films and Surfaces (Nanocoatings) 2021-2031" report has been added to ResearchAndMarkets.com's offering. This ...

Being able to quantify a surface finish is both a complex and necessary task. While surface topography relates to a three-dimensional property, the most accepted surface measurement parameter is ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The NPFLEX-1000 white light interferometry ...