Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

The concept of zero defect manufacturing has been around for decades, arising first in the aerospace and defense industry. Since then, this manufacturing approach has been adopted by the automotive ...