The foundation model underlying Quality Agent is trained on Lumafield’s corpus of industrial CT data, a volumetric record of manufactured products that general-purpose AI models cannot meaningfully ...
A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...
AI, EVs, advanced nodes and packaging are driving demand for e-beam, front-end and foundry inspection, plus high-throughput X ...
Researchers developed CoatingDet, a publicly available dataset containing 5,416 high-resolution images of wind turbine tower ...
This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...
WEST LAFAYETTE, Ind. — A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car’s steering to making your laptop ...
Water intrusion drives most construction disputes because the exterior building envelope is not formally performance-verified ...
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