Tech Xplore on MSN

Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Interesting Engineering on MSN

Korean scientists detect hidden defects in solar cells with 1,000x sensitivity boost

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
EurekAlert!

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Nasdaq

ACM Research Announces Major Performance Breakthrough for Ultra C Tahoe Cleaning Tool for Front-End Semiconductor Manufacturing

FREMONT, Calif., Nov. 07, 2024 (GLOBE NEWSWIRE) -- ACM Research, Inc. (“ACM”) (NASDAQ: ACMR), a leading supplier of wafer processing solutions for semiconductor and advanced wafer-level packaging ...
Semiconductor Engineering

Nearly Invisible: Defect Detection Below 5nm

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.