Business Wire

Analog Devices’ MEMS Accelerometers Enable Early Detection of Structural Defects

NORWOOD, Mass.--(BUSINESS WIRE)--Analog Devices, Inc. (ADI) today announced three-axis, MEMS accelerometers that perform high resolution vibration measurement with very low noise to enable the early ...
EDN

MEMS ICs detect structural defects

This product is featured in EDN's Hot 100 products of 2016. See all 100 here. Three-axis MEMS accelerometers, Analog Devices’ ADXL354 and ADXL355 perform high-resolution vibration measurement to ...
Embedded

Optimizing high precision tilt/angle sensing: Establishing baseline performance

In part one of this series, we reviewed the internal structure of a 3-axis high precision MEMS accelerometer. In this second article, we will review how to acquire a good starting dataset to establish ...
The Engineer

Managing Stress and Strain to Get the Best Performance in High Precision Tilt/Angle Sensing

Accelerometers are marvellous sensors that enable the sensing of static and dynamic accelerations as varied as the orientation with respect to gravity to the subtle motions of bridges beginning to ...